61. Transmission electron microscopy :
پدیدآورنده : David B. Williams, C. Barry Carter.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Materials-- Microscopy.,Transmission electron microscopy.,Elektronenmikroskopie.,Materials-- Microscopy.,Transmission electron microscopy.,Werkstoff.
رده :
TA417
.
23
62. Transmission electron microscopy of semiconductor nanostructures :
پدیدآورنده : Andreas Rosenauer.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Semiconductors-- Analysis.,Semiconductors-- Microscopy.,Transmission electron microscopy.,33.68 surfaces, interfaces and thin layers.,51.39 materials testing, properties of materials: other.,Durchstrahlungselektronenmikroskopie,Durchstrahlungselektronenmikroskopie.,Física moderna.,Nanostruktur,Nanostruktur.,Semiconductors-- Analysis.,Transmission electron microscopy.,Verbindungshalbleiter,Verbindungshalbleiter.
رده :
QD139
.
S34
R67
2003